20 results
Fine Structure Mapping in Graphene: From Electronic Transitions to Atomic Orbitals
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- Microscopy and Microanalysis / Volume 28 / Issue S1 / August 2022
- Published online by Cambridge University Press:
- 22 July 2022, pp. 2554-2555
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- August 2022
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Evaluation of Aberration-corrected Optical Sectioning for Exploring the Core Structure of ½[111] Screw Dislocations in BCC Metals
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 432-433
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- July 2017
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HAADF-STEM analysis of the composition distribution in InAlAsSb/InGaAs/InP layers for solar cells applications
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- Microscopy and Microanalysis / Volume 22 / Issue S4 / March 2016
- Published online by Cambridge University Press:
- 14 March 2016, pp. 30-31
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- March 2016
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High-Precision Chemical Analysis and Structural Determination of Functional Oxides by STEM-EELS
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1918-1919
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- August 2013
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Evidence for a Thickness-Dependent Crossover from Charge- to Strain-Mediated Magnetoelectric Coupling in La0.7Sr0.3MnO3 / PbZr0.2Ti0.8O3 Thin Film Oxide Heterostructures
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- Microscopy and Microanalysis / Volume 19 / Issue S2 / August 2013
- Published online by Cambridge University Press:
- 09 October 2013, pp. 1964-1965
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- August 2013
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Identification of Single Atoms Using Energy Dispersive X-ray Spectroscopy
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 976-977
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- July 2012
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A Combined STEM-EELS and Neutron Reflectometry Study of Charge- and Strain-Mediated Magnetoelectric Coupling in LSMO/PZT Heterostructures
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
- Published online by Cambridge University Press:
- 23 November 2012, pp. 1912-1913
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- July 2012
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SDD-EDS: Element Analysis of Nanostructures in TEM
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- Microscopy and Microanalysis / Volume 18 / Issue S2 / July 2012
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- 23 November 2012, pp. 1058-1059
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- July 2012
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Atomic-scale Interaction Dynamics in Few-layer Hexagonal Boron Nitride (h-BN)
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1258-1259
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- July 2011
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Single-atom Sensitive Chemical and Structural STEM Characterization of Two-Dimentional MoS2 Nano-catalysts
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1250-1251
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- July 2011
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Aberration-Corrected STEM Investigation of Metallic Ti Cluster Formation in Mg-Ti Hydrides
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1678-1679
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- July 2011
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Optimized FIB Sample Preparation for Atomic Resolution Analytical STEM at Low kV - A Key Requirement for Successful Application
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 630-631
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- July 2011
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Novel Multivariate Statistical Analysis Methods for STEM/EELS
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 1306-1307
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- July 2011
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Charge Transfer in Magnetic Heterostructures from Atomic Resolution EELS
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 09 April 2017, pp. 1404-1405
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- July 2011
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Applications of Atomic-Resolution EELS Mapping at Low kV
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
- Published online by Cambridge University Press:
- 08 April 2017, pp. 786-787
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- July 2011
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Analytical High-Resolution Studies of Transparent Conductive Oxides and their Interfaces with Active Si Regions for Photovoltaic Applications
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 1340-1341
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- August 2008
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High Resolution HAADF-STEM Imaging Analysis of N related defects in GaNAs Quantum Wells
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
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- 03 August 2008, pp. 318-319
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- August 2008
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Studying Vanadium-based Perovskites by Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1178-1179
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- August 2006
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Applications of Atomic Scale Scanning Transmission Electron Microscopy
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
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- 31 July 2006, pp. 134-135
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- August 2006
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Effect of the Growth Temperature in the Composition Fluctuation of GaInNAs/GaAs Quantum Wells
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 754-755
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- August 2006
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